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  1. Dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG), and at-speed BIST Sample
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    Dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG), and at-speed BIST

    ... advanced testability features including ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCAN921821
    Dodany:
  2. Dual 1.5-Gbps 2:1/1:2 LVDS mux/buffer with pre-emphasis and IEEE 1149.6 Sample
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    Dual 1.5-Gbps 2:1/1:2 LVDS mux/buffer with pre-emphasis and IEEE 1149.6

    ... .6 circuitry supports testability of both single ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCAN15MB200
    Dodany:
  3. 1.5-Gbps 2x2 LVDS crosspoint switch with pre-emphasis and IEEE 1149.6 Sample
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    1.5-Gbps 2x2 LVDS crosspoint switch with pre-emphasis and IEEE 1149.6

    ... .6 circuitry supports testability of both single ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCAN90CP02
    Dodany:
  4. 4-channel LVDS buffer/repeater with pre-emphasis Sample
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    4-channel LVDS buffer/repeater with pre-emphasis

    ... . Integrated testability circuitry supports ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCAN90004
    Dodany:
  5. Dual-Channel, 12-Bit, 32-MSPS Analog-to-Digital Converter (ADC) Sample
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    Dual-Channel, 12-Bit, 32-MSPS Analog-to-Digital Converter (ADC)

    ... for multiplexing and testability on a PC board ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    ADS2806
    Dodany:
  6. Dual-Channel, 12-Bit, 50-MSPS Analog-to-Digital Converter (ADC) Sample
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    Dual-Channel, 12-Bit, 50-MSPS Analog-to-Digital Converter (ADC)

    ... for multiplexing and testability on a PC board ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    ADS2807
    Dodany:
  7. 12-Bit, 53-MSPS Analog-to-Digital Converter (ADC) Sample
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    12-Bit, 53-MSPS Analog-to-Digital Converter (ADC)

    ... for multiplexing and testability on a PC board ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    ADS807
    Dodany:
  8. Scan Test Device With 18-Bit Registered Bus Transceiver Sample
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    Scan Test Device With 18-Bit Registered Bus Transceiver

    ... Instruments SCOPETM testability integrated circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ABT18502
    Dodany:
  9. Scan Test Devices With Octal Bus Transceivers And Registers Sample
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    Scan Test Devices With Octal Bus Transceivers And Registers

    ... Instruments SCOPE™ testability integrated-circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ABT8646
    Dodany:
  10. Scan Test Devices With Octal Bus Transceivers And Registers Sample
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    Scan Test Devices With Octal Bus Transceivers And Registers

    ... Instruments SCOPETM testability integrated-circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ABT8652
    Dodany:
  11. Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops Sample
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    Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops

    ... Instruments SCOPETM testability integrated-circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54BCT8374A
    Dodany:
  12. Test bus controller Sample
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    Test bus controller

    ... Instruments SCOPETM testability integrated-circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ACT8990
    Dodany:
  13. Military 4-ch, 4.5-V to 5.5-V inverters with TTL-compatible CMOS inputs and 3-state outputs Sample
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    Military 4-ch, 4.5-V to 5.5-V inverters with TTL-compatible CMOS inputs and 3-state outputs

    ... Instruments SCOPETM testability integrated-circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ACT8997
    Dodany:
  14. 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers Sample
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    10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers

    ... (TITM) SCOPETM testability integrated-circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN74ABT8996
    Dodany:
  15. Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces Sample
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    Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces

    ... Instruments SCOPETM testability integrated-circuit ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN74ACT8990
    Dodany: