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12-bit, dual 3.2-GSPS or single 6.4-GSPS, RF-sampling analog-to-digital converter (LVDS interface) | ACF | 256 | -40 to 85

Texas Instruments

12-bit, dual 3.2-GSPS or single 6.4-GSPS, RF-sampling analog-to-digital converter (LVDS interface) | ACF | 256 | -40 to 85 RSS Sample
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MPN:
ADC12DL3200ACF
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TEXAS INSTRUMENTS
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Ostatnio widziany:

The ADC12DL3200 is an RF-sampling, giga-sample,

analog-to-digital converter (ADC) that can

directly sample input frequencies from DC to above

10 GHz. In dual-channel mode, the ADC12DL3200 can

sample up to 3200 MSPS and in single-channel mode

up to 6400 MSPS. Programmable tradeoffs in channel

count (dual-channel mode) and Nyquist bandwidth

(single-channel mode) allow development of

flexible hardware that meets the needs of both

high-channel count or wide instantaneous signal

bandwidth applications. Full-power input bandwidth

(–3 dB) of 8.0 GHz and a useable frequency range

allows direct RF sampling of L-band, S-band,

C-band, and X-band for frequency agile

systems.

The ADC12DL3200 uses a low-latency, low-voltage

differential signaling (LVDS) interface for

latency sensitive applications or when the

simplicity of LVDS is preferred. The interface

uses up to 48 data pairs, four double data rate

(DDR) clocks, and four strobe signals arranged in

four 12-bit data buses. The interface supports

signaling rates of up to 1.6 Gbps. Strobe signals

simplify synchronization across buses and between

multiple devices. The strobe is generated

internally and can be reset at a deterministic

time by the SYSREF input. Multi-device

synchronization is further eased by innovative

synchronization features such as noiseless

aperture delay (T AD) adjustment and

SYSREF windowing.

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