CD4012BE CMOS double 4 input NAND gate, 3 ... 15 V, DIP-14

CMOS Dual 4-Input NAND Gate Description CD4011B, CD4012B, and CD4023B NAND gates provide the system designer with direct implementation of the NAND function and supplement the existing family of CMOS gates. All inputs and outputs are buffered. The CD4011B, CD4012B, and CD4023B types are supplied in 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes).

Features - Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V - Buffered inputs and outputs - Standardized symmetrical output characteristics - Maximum input current of 1 µA at 18 V over-full package temperature range; 100 nA at 18 V and 25°C - 100% tested for quiescent current at 20 V - 5-V, 10-V, and 15-V parametric ratings - Noise margin (over full package temperature range:

- 1 V at VDD = 5 V

- 2 V at VDD = 10 V

- 2.5 at VDD = 15 V - Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of "B" Series CMOS Devices"

- Quad 2 Input-CD4011B

- Dual 4 Input-CD4012B

- Triple 3 Input-CD4023B