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  1. Enhanced scan bridge multidrop addressable IEEE 1149.1 (JTAG) port Sample
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    Enhanced scan bridge multidrop addressable IEEE 1149.1 (JTAG) port

    ... instruction. The 32-bit TCK counter enables built ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCANSTA111
    Dodany:
  2. 7-port multidrop IEEE 1149.1 (JTAG) multiplexer Sample
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    7-port multidrop IEEE 1149.1 (JTAG) multiplexer

    ... instruction. The 32-bit TCK counter enables built ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCANSTA112
    Dodany:
  3. 20 to 66-MHz 10-bit serializer with IEEE 1149.1 test access Sample
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    20 to 66-MHz 10-bit serializer with IEEE 1149.1 test access

    ... (TMS), Test Clock (TCK), and the optional ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCAN921023
    Dodany:
  5. 20 to 66-MHz 10-bit deserializer with IEEE 1149.1 test access Sample
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    20 to 66-MHz 10-bit deserializer with IEEE 1149.1 test access

    ... (TMS), Test Clock (TCK), and the optional ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCAN921224
    Dodany:
  6. 9-channel bus LVDS transceiver with boundary scan Sample
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    9-channel bus LVDS transceiver with boundary scan

    ... (TMS), Test Clock (TCK), and the optional ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SCAN92LV090
    Dodany:
  7. Scan Test Device With 18-Bit Registered Bus Transceiver Sample
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    Scan Test Device With 18-Bit Registered Bus Transceiver

    ... ), and test clock (TCK). Additionally, the test ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ABT18502
    Dodany:
  8. Scan Test Devices With Octal Bus Transceivers And Registers Sample
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    Scan Test Devices With Octal Bus Transceivers And Registers

    ... ), and test clock (TCK). Additionally, the test ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ABT8646
    Dodany:
  9. Scan Test Devices With Octal Bus Transceivers And Registers Sample
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    Scan Test Devices With Octal Bus Transceivers And Registers

    ... ), and test clock (TCK). Additionally, the test ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ABT8652
    Dodany:
  10. Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops Sample
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    Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops

    ... ), and test clock (TCK). Additionally, the test ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54BCT8374A
    Dodany:
  11. Test bus controller Sample
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    Test bus controller

    ... bus - test clock (TCK), test mode select (TMS ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ACT8990
    Dodany:
  12. Military 4-ch, 4.5-V to 5.5-V inverters with TTL-compatible CMOS inputs and 3-state outputs Sample
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    Military 4-ch, 4.5-V to 5.5-V inverters with TTL-compatible CMOS inputs and 3-state outputs

    ... the test clock pin (TCK). The 8-bit programmable ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN54ACT8997
    Dodany:
  13. Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces Sample
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    Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces

    ... bus - test clock (TCK), test mode select (TMS ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN74ACT8990
    Dodany:
  14. Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators Sample
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    Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators

    ... the test clock pin (TCK). The 8-bit programmable ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN74ACT8997
    Dodany:
  15. Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces Sample
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    Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces

    ... well as to divide down TCK from CLKIN. A discrete ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN74LVT8980A
    Dodany:
  16. Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters Sample
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    Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters

    ... well as to divide down TCK from CLKIN. A discrete ...
    • Darmowa próbka
    Sklep:
    Texas Instruments
    Producent:
    TEXAS INSTRUMENTS
    MPN:
    SN74LVT8980A-EP
    Dodany: